in memory of Peter Bendix
Peter Bendix Peter Bendix (1946-2007) received the B.Sc. degree in physics from the California Institute of Technology, Pasadena, in 1968 and the Ph.D. degree in particle physics from the University of British Columbia, Vancouver, B.C., in 1973. From 1981-83, he worked at AMD in bipolar device modeling and characterization, and he worked at VLSI Technology in MOS device modeling and characterization from 1983-88. From 1988-1991 he founded his own modeling and characterization software company, and from 1991 to 1995 he worked at TMA (Technology Modeling Associates) doing software development for IC related products. He joined LSI Logic in 1996 as manager of the modeling group and became Director of Device Technology in 1997. Later, he worked at Xpedion Design Systems, Inc. where he was responsible for spice/compact modeling.
 

Recent dedications in memory of Peter
  1. D. Petranovic and  Y. Le Coz;  "A Sum-over-Paths Impulse Response Moment Extraction Algorithm for IC Interconnect Networks: Verification Coupled RLCM Lines", VMIC'07
  2. Y. Granik, S. Shang, M.  Niehoff; "Etch Proximity Correction by Retargeting", BACUS'07
  3. V. Sukharev, A. Kteyan, E. Zschech, W.D. Nix; "Physics Based Modeling of Electromigration-Induced Degradation Phenomena in Copper Interconnects", SISPAD'07
  4. W. Grabinski; MOS-AK/ESSDERC/ESSCIRC Compact Modeling Workshop
Peter's Publications

Knuth-Bendix Completion Algorithm:
  1. D. Knuth and P. Bendix. "Simple word problems in universal algebras." In Computational Problems in Abstract Algebra (Ed. J. Leech; Proc. Conf., Oxford, 1967) pp. 263-297, 1970
  2. Donald Knuth "All Questions Answered" NOTICES OF THE AMS VOLUME 49, NUMBER 3 (lecture presented on October 5, 2001, at the Technische Universität München)
  3. Wikipedia link: http://en.wikipedia.org/wiki/Knuth-Bendix_completion_algorithm
  4. MathWorld link: http://mathworld.wolfram.com/Knuth-BendixCompletionAlgorithm.html
Applying Glauber Theory to Transport Theory in Semiconductors:
  1. Robert W. Bower and Peter Bendix; early'80; private communication
Selected IEEE Publications:
  1. Yoon Huh; Bendix, P.; Kyungjin Min; Jau-Wen Chen; Ravindra Narayan; Johnson, L.D.; Voldman, S.H., "ESD-induced internal core device failure: new failure modes in system-on-chip (SOC) designs," System-on-Chip for Real-Time Applications, 2005. Proceedings. Fifth International Workshop on, vol., no., pp. 47-53, 20-24 July 2005
  2. Jaesik Lee; Yoonjong Huh; Bendix, P.; Sung-Mo Kang, "Design of ESD power protection with diode structures for mixed-power supply systems," Solid-State Circuits, IEEE Journal of, vol.39, no.1, pp. 260-264, Jan. 2004
  3. Bendix, P.; Rakers, P.; Wagh, P.; Lemaitre, L.; Grabinski, W.; McAndrew, C.C.; Gu, X.; Gildenblat, G., "RF distortion analysis with compact MOSFET models," Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, vol., no., pp. 9-12, 3-6 Oct. 2004
  4. Gildenblat, G.; McAndrew, C.; Wang, H.; Wu, W.; Foty, D.; Lemaitre, L.; Bendix, P., "Advanced compact models: gateway to modern CMOS design," Electronics, Circuits and Systems, 2004. ICECS 2004. Proceedings of the 2004 11th IEEE International Conference on, vol., no., pp. 638-641, 13-15 Dec. 2004
  5. Bendix, P.; Foty, D.; Pachura, D., "Practical aspects of MOS transistor model "accuracy" in modern CMOS technology," Electronics, Circuits and Systems, 2004. ICECS 2004. Proceedings of the 2004 11th IEEE International Conference on, vol., no., pp. 642-645, 13-15 Dec. 2004
  6. Bendix P.; Foty D.; and Pachura D.; "A Practical Examination of MOS Transistor Model “Accuracy” in Modern CMOS Technology" MOS-AK Meeting Crolles, France 5 May 2003
  7. Jaesik Lee; Ki-Wook Kim; Yoonjong Huh; Bendix, P.; Sung-Mo Kang, "Chip-level charged-device modeling and simulation in CMOS integrated circuits," Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol.22, no.1, pp. 67-81, Jan 2003
  8. Le Coz, Y.L.; Krishna, D.; Petranovic, D.M.; Loh, W.M.; Bendix, P., "A Sum-over-Paths impulse-response moment-extraction algorithm for IC-interconnect networks: verification, coupled RC lines," Computer Aided Design, 2003. ICCAD-2003. International Conference on, vol., no., pp. 665-670, 9-13 Nov. 2003
  9. Bendix, P.; "Detailed Comparison of the SP2001, EKV, and BSIM3 Models", Workshop on Compact Modeling, Fifth International Conference on Modeling and Simulation of Microsystems April 22-25, 2002, San Juan, Puerto Rico, U.S.A.
  10. Axelrad, V.; Huh, Y.; Chen, J.W.; Bendix, P., "A novel CDM-like discharge effect during human body model (HBM) ESD stress," Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on, vol., no., pp. 115-118, 2002
  11. Huh, Y.J.; Axerad, V.; Chen, J.-W.; Bendix, P., "The effects of substrate coupling on triggering uniformity and ESD failure threshold of fully silicided NMOS transistors," VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on, vol., no., pp. 220-221, 2002
  12. Bendix, P., "Spice model quality: process development viewpoint," Quality Electronic Design, 2001 International Symposium on, vol., no., pp.477-481, 2001
  13. Jaesik Lee; Yoonjong Huh; Bendix, P.; Sung-Mo Steve Kang, "Design-for-ESD-reliability for high-frequency IO interface circuits in deep-submicron CMOS technology," Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on, vol.4, no., pp.746-749 vol. 4, 6-9 May 2001
  14. Jaesik Lee; Yoonjong Huh; Bendix, P.; Sung-Mo Kang, "Understanding and addressing the noise induced by electrostatic discharge in multiple power supply systems," Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on, vol., no., pp.406-411, 2001
  15. Cresswell, M.W.; Arora, N.; Allen, R.A.; Murabito, C.E.; Richter, C.A.; Gupta, A.; Linholm, L.W.; Pachura, D.; Bendix, P., "Test chip for electrical linewidth of copper-interconnect features and related parameters," Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on, vol., no., pp.183-188, 2001
  16. Li, Q.; Huh, Y.J.; Chen, J.W.; Bendix, P.; Kang, S.M., "ESD design rule checker," Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on, vol.5, no., pp.499-502 vol. 5, 2001
  17. Jaesik Lee; Yoonjong Huh; Bendix, P.; Sung-Mo Kang, "Noise-aware design for ESD reliability in mixed-signal integrated circuits," ASIC/SOC Conference, 2001. Proceedings. 14th Annual IEEE International, vol., no., pp.437-441, 2001
  18. Li, Q.; Huh, Y.J.; Chen, J.W.; Bendix, P.; Kang, S.M., "Full chip ESD design rule checking," Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on, vol.5, no., pp.503-506 vol. 5, 2001
  19. Gildenblat, G.; Chen, T.L.; Bendix, P., "Closed-form approximation for the perturbation of MOSFET surface potential by quantum-mechanical effects," Electronics Letters, vol.36, no.12, pp.1072-1073, 8 Jun 2000
  20. Bendix, P.; Loh, W.; Lee, J.J.; Li, W., "Optimization of a 0.13 um CMOS backend interconnect process for ASIC SOC: low K dielectric vs. Cu conductor," ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International, vol., no., pp.114-118, 2000
  21. Jeasik Lee; Yoonjong Huh; Jau-Wen Chen; Bendix, P.; Sung-Mo Kang, "Chip-level simulation for CDM failures in multi-power ICs," Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000, vol., no., pp.456-464, 2000
  22. Gildenblat, G.; Chen, T.L.; Bendix, P., "Analytical approximation for perturbation of MOSFET surface potential by polysilicon depletion layer," Electronics Letters, vol.35, no.22, pp.1974-1976, 28 Oct 1999
  23. Gildenblat, G.; Chen, T.L.; Bendix, P., "Computationally efficient implementation of charge sheet model [MOSFET]," Electronics Letters, vol.35, no.10, pp.843-844, 13 May 1999
  24. Assad, F.; Zhibin Ren; Datta, S.; Lundstrom, M.; Bendix, P., "Performance limits of silicon MOSFET's," Electron Devices Meeting, 1999. IEDM Technical Digest. International, vol., no., pp.547-550, 1999
  25. Zarkesh-Ha, P.; Bendix, P.; Loh, W.; JinJoo Lee; Meindl, J.D., "The impact of Cu low on chip performance," ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International, vol., no., pp.257-261, 1999
  26. Sung, R.; Bendix, P.; Das, M.B., "Extraction of high-frequency equivalent circuit parameters of submicron gate-length MOSFET's," Electron Devices, IEEE Transactions on, vol.45, no.8, pp.1769-1775, Aug 1998
  27. Tong Li; Bendix, P.; Suh, D.; Huh, Y.J.; Rosenbaum, E.; Kapoor, A.; Kang, S.M., "Optimum design for a two-stage CMOS IO ESD protection circuit," Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on, vol.2, no., pp.113-116 vol.2, 31 May-3 Jun 1998
  28. Jiang, W.; Le, H.; Kim, S.A.; Chung, J.E.; Wu, Y.-J.; Bendix, P.; Jensen, J.; Ardans, R.; Prasad, S.; Kapoor, A.; Kopley, T.E.; Dungan, T.; Marcoux, P., "Digital test circuit design and optimization for AC hot-carrier reliability characterization and model calibration under realistic high frequency stress conditions," Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on, vol., no., pp.56-62, 17-20 Mar 1997
  29. Wenjie Jiang; Huy Le; Dao, S.; Kim, S.A.; Stine, B.; Chung, J.E.; Yu-Jen Wu; Bendix, P.; Prasad, S.; Kapoor, A.; Kopley, T.E.; Dungan, T.; Manna, I.; Marcoux, P.; Lifeng Wu; Chen, A.; Zhihong Liu, "Key hot-carrier degradation model calibration and verification issues for accurate AC circuit-level reliability simulation," Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International, vol., no., pp.300-306, 8-10 Apr 1997
  30. Li, T.; Suh, D.; Ramaswamy, S.; Bendix, P.; Rosenbaum, E.; Kapoor, A.; Kang, S.M., "Study of a CMOS IO protection circuit using circuit-level simulation," Reliability Physics Symposium, 1997. 35th Annual Proceedings., IEEE International, vol., no., pp.333-338, 8-10 Apr 1997
  31. Bendix, P., "Subtleties of SPICE MOSFET parameter extraction," Microelectronic Test Structures, 1989. ICMTS 1989. Proceedings of the 1989 International Conference on, vol., no., pp. 65-68, 13-14 March 1989
Peter's publications from other data bases:

edited wg/oct/07(#03633)