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aBook OPEN SOURCE TCAD/EDA FOR COMPACT MODELING

Editors: Wladek Grabinski and Daniel Tomaszewski
Publisher: Mark de Jongh [Mark.deJongh@springer-sbm.com]
1st Edition., 2014,  Hardcover; ISBN: xxx-xx-xxx-nnnn-n
www. springer-sbm.com

Table of contents
Preface
[tbd]
 
Introduction
Wladek Grabinski, GMC Suisse and Daniel Tomaszewski, ITE Warsaw

Chapter_1
Numerical Cogenda TCAD MOSFET Device Simulations
Tutorial to Genius Device Simulator
Physics of Device Simulation
Numerical Method in Device Simulation
Device simulation: A MOS example

Chapter_2 Semiconductor Device Simulation Using DEVSIM
Juan E. Sanchez
Introduction
BJT Physics
BJT Simulation
Conclusion and Future Work

Chapter_3 Device Level Parameter Extraction
Daniel Tomaszewski, Wladek Grabinski
Introduction
Parameter extractors overview
General optimization algorithms
Profile1d: open source extractor
Examples:
Diode, MOSCAP, BJT, MOSFET, IC Subcircuit
Summary
Appendix: List Profile1d  commands
 
Chapter_4
Schematic entry and circuit simulation with Qucs
Mike Brinson
Introduction
The Qucs graphical user interface
Basic principles of circuit schematic capture
Qucs parameter sweep techniques
Qucs small signal AC circuit and noise simulation
Qucs transient simulation
Qucs subcircuits
Including SPICE netlists in Qucs schematic diagrams
Qucs post-simulation data processing
Summary
 
Chapter_5
Qucs modeling and simulation of analog/RF devices and circuits
Mike Brinson
Introduction
Circuit and system modeling using macromodels
Qucs equation-defined device models
Qucs and QucsStudio compact model development with the ADMS Verilog-A model synthesizer/compiler
QucsStudio implementation
More RF examples
From Qucs to QucsStudio: future directions in analog simulation and device modeling
Summary

Chapter_6 Simulations of Digital IC Blocks
Zia Abbas, Antonio Mastrandrea, Francesco Menichelli and Mauro Olivieri
Basics on Nano-scale Digital CMOS Analysis: Propagation Delay and Static Power   
Basic Ngspice Delay and Leakage Current Analysis   
Automated Delay Characterization of CMOS Standard Cells   
Automated Leakage Current Characterization In CMOS Standard Cells
Additional Material


Chapter_7 Hybrid TCAD Circuit Simulations

Chapter_8 Standardized Data Exchange For Device Modeling Tools
Franz Sischka
General Requirements For A Data Format Standard
Most Common Measurement Data Formats For Device Modeling
MDM (Measured Data Management) Format
Summary

Index
update March'17 Contents subject to change ©2017 No.#4368 All rights reserved. WG