Arbeitskreis MOS-Modelle und Parameterextraktion
MOS Modeling and Parameter Extraction Working Group
MOS-AK/ESSDERC/ESSCIRC Workshop
Friday, 19 September 2008 at Edinburgh International Conference Centre (EICC)
Agenda: Friday, 19 September 2008 at Edinburgh International Conference Centre (EICC)
  • Morning Session
    • 9:00-11:30 Oral presentations
    • 10:00-10:30 (coffee break)
  • Poster Session
    • 11:30-12:00 Posters
    • 12:00-13:00 (lunch)
  • Afternoon Session
    • 13:00-16:00 Oral presentations
    • 14:30-15:00 (coffee break)
Sponsors of the MOS-AK Workshop
Accelicon Tanner EDA 
XFab
     media sponsor
     SUSS MicroTec
 Technical Program Promoters
EuroTraining FSA 
ijnm_wiley SSE
Poster Session Program
Display Format: Citation Citation & Abstract
11:30-12:00 Poster Session
Chair: W.Grabinski, GMC
 MOS_AK Recommendation Simulation of CMOS Inverters Based on the Novel Surrounding Gate Transistors. A Verilog-A implementation
A. Roldán, J.B. Roldán, F. Gámiz; Universidad de Granada
  Xsim: Unification of MOSFET Compact Models with the Unified Regional Modeling Approach
Guojun Zhu, Guan Huei See, Shihuan Lin, Chengqing Wei, Junbin Zhang, Zuhui Chen, Ramachandran Selvakumar, and Xing Zhou; Nanyang Technological University,
  Ngspice Batch and Distributed Analysis and Data Postprocessing
Alberto Lucchini, Paolo Nenzi, Francesco Nizzi, Mauro Olivieri and Lionel Sainte Cluque; Uni Roma "La Sapienza", NGSpice SourceForge.
  Evaluation of the EKV3 Compact Model for Low Temperature Analog Circuit Simulation
Patrick Martin;
CEA-LETI Minatec, Raphaël Fascio; CEA-LETI Minatec, Gérard Ghibaudo; IMEP Minatec and Matthias Bucher; TUC
 MOS_AK Recommendation Lateral PNP Transistor Modeling with SPICE Models
Vaclav Panko; OnSemi
 MOS_AK Recommendation Vertical PNP Transistor TCAD Simulation
Milos Skalsky; OnSemi
  An Integrated Approach for More Accurate, Wafer-Level Parameter Measurements
Stojan Kanev, Andrej Rumiantsev, Joshua Preston SUSS MicroTec
  Verilog-A Model Support from Tanner EDA - Bringing benefits to developer and user alike
Paul Double; EDA Solutions
  PQA – Variability-Aware Verification Platform for the sub-45nm PDK
Tim K. Smith, Xisheng Zhang, Albert. Li, James Ashforth-Pook; Accelicon
  Compact Modeling of SiON MOST Devices
Jakub Jasinski, Grzegorz Głuszko, Lidia Lukasiak, Andrzej Jakubowski; Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, Wladyslaw Grabinski;GMC, Daniel Tomaszewski; ITE
Warsaw
  RF – MOS Modelling
Sebastian Schmidt, X-FAB, Erfurt
  Effect of a Local Ground and Probe Radiation on the Microwave Characterization of Integrated Inductors
Gavin Fisher, Cascade Microtech Europe
12:00 End of the MOS-AK Poster's Session
MOS_AK RecommendationMOS-AK presentations recommended for further publication
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No.#6484
update: 30-Sept-08 (rev. b)
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