Arbeitskreis MOS-Modelle und Parameterextraktion
MOS Modeling and Parameter Extraction Working Group
MOS-AK Meeting
Friday, 4 April 2008 at MiPlaza, High Tech Campus Eindhoven
Sponsors of the MOS-AK Meeting
Technical Program Promoters
EuroTraining FSA 
ijnm_wiley RI_Journal
Agenda: Friday, 4 April 2008 at MiPlaza, High Tech Campus Eindhoven
Workshop Chair: Thomas Gneiting
Technical Program Coordinator: W.Grabinski
  • Morning Session
    • 9:00-11:00 Oral presentations
    • 10:00-10:30 (coffee break)
  • Poster Session
    • 11:30-12:00 Posters
    • 12:00-13:00 (lunch)
  • Afternoon Session
    • 13:00-16:00 Oral presentations
    • 14:30-15:00 (coffee break)
Workshop Program
Display Format: Citation Citation & Abstract
9:00 Workshop Opening and Welcome Note:
  MiPlaza/Agilent/Cascade Partnership
Gerjan van de Walle (MiPlaza)
  Status of the PSP model
G.D.J. Smit, A.J. Scholten, B.A. de Vries, and D.B.M. Klaassen (NXP-TSMC Research Centre)
X. Li, W. Wu, and G. Gildenblat (Arizona State University)
  Scalable High-frequency Modeling with EKV3
Matthias Bucher (TUC), Antonios Bazigos (NTUA)
  Versatile Simulator-independent MOSFET Extractor
Thomas Gneiting (AdMOS)
10:30-11:30 Live Demonstration in the Electronic Measurement Lab:
  Fully automated wafer characterisation (S-parameters, IP3&compression and noise-figure)
A step by step guide to practical RF device measurements
G.Fisher (Cascade) and D.Bockstal (Agilent)
11:30-12:00 Poster Session:
12:00-13:00 Lunch:
13:00-16:00 Afternoon Session:
  The GSA MS/RF Model Checklist
Thomas Moerth (austriamicrosystems) Roberto Tinti (Agilent Technologies)
 star Qucs: A GPL software package for circuit simulation, compact device modeling and circuit macromodeling from DC to RF and beyond
M. E. Brinson and S. Jahn (Qucs project development team)
  Statistical Modeling of Leakage in Nano CMOS
Wieslaw Kuzmicz (PW)
  A Unique System Concept to Improve the Accuracy of Wafer-Level Flicker-Noise Characterization
Andrej Rumiantsev, Stojan Kanev (SUSS MicroTec Test Systems GmbH)
 star RF Extraction Techniques for Series Resistances of MOSFETs
J. C. Tinoco and J.-P. Raskin (UCL)
  Large-signal measurements and the impact on transistor model improvement
Marc Vanden Bossche (NMDG NV)
 star Simple and Accurate Approach to Implement the Complex Trans-conductance in Time-Domain Simulators
M. Homayouni, D. Schreurs, and B. Nauwelaers (KUL)
16:00 End of the Workshop
star MOS-AK presentations recommended for further publication
update: 12-April-08 (rev.e)
Contents subject to change 1999-2008 All rights reserved. WG
Graphics 2008 Oliver