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| 9:30 | Continental breakfast | |
| 10:00 | W. Grabinski | Welcome |
| 10:10 | M. Declercq | Brief introduction to LEG at EPF Lausanne |
| Matching and Compact Modeling Session | ||
| 10:30 | F. Krummenacher | Matching Analysis of the Analog Circuits |
| 11:00 | H. Hoeller | Mismatch Characterization of Semiconductor Devices in BiCMOS Technology |
| 11:30 | B. Hertwig | Application of WEVA as optimization tool for MOS models (example of the EPFL EKV model) |
| 12:00 | Lunch | |
| Statistic and Compact Modeling Session | ||
| 13:00 | F. Sischka | Statistical Package of IC-CAP |
| 13:30 | T. Gneiting | Statistical Modeling: BSIM3 Example |
| 14:00 | M. Bucher | EKV v3.0: Advances in MOSFET Compact Modeling |
| 14.30 | W. Grabinski | Are we ready to create European CMC? |
| 16:00 | Adjourn |
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