Arbeitskreis
MOS-Modelle und Parameterextraktion MOS Modeling and Parameter Extraction Working Group MOS-AK Meeting Noise in MOSFET Devices Friday, 20 April 2007 Room Palladium, Schloss Premstaetten |
Agenda | ||
Technical Program Coordinator: E.Seebacher and W.Grabinski
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Sponsors and Promoters |
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Workshop Program | ||||||
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9:00 - 11:30 | Morning Session - Chair: E. Seebacher and W.Pribyl | |||||
Welcome, Workshop Opening and Presentation of the Modelling Activities at austriamicrosystems Ehrenfried Seebacher, austriamicrosystems | ||||||
Activities of TU Graz Institute for Electronic Wolfgang Pribyl, TU Graz |
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Measurements and Modeling of Noise in Advanced MOSFETs Mitiko Miura-Mattausch, IEEE Fellow, TU Hiroshima |
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Numerical Simulation of Electronic Noise in Silicon MOSFETs Christoph Jungemann, Uni München |
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Noise Modeling in Lateral Asymmetric MOSFET Ananda Sankar Roy, EPFL |
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Electrical Measurements and Chip Repair with Nanoscale Probes Peter Hadley, TU Graz |
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Posters: | ||||||
Turn-key, Fully Automated SPICE Model Quality Assurance Solutions James Ashforth-Pook, Accelicon Technologies, Europe |
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A Compact Quantum Model of Nanoscale Double-Gate MOSFETs for RF and Noise Simulations A. Lazaro, B. Nae, O. Moldovan and B. Iñiguez; Universitat Rovira i Virgili |
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GNU Simulators Supporting Verilog-A Compact Model Standardization (photo) S. Jahn, M. Brinson, M. Margraf, H. Parruitte, B. Ardouin, P. Nenzi and L. Lemaitre |
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Flicker Noise Modeling System Thomas Gneiting, AdMOS | ||||||
11:30-12:00 | AMS Fab Tour - Guide: Ehrenfried Seebacher, austriamicrosystems | |||||
12:00-13:30 | Lunch (MOS-AK Photo Session) | |||||
13:30-16:00 | Afternoon Session - Chair: E. Seebacher and W.Pribyl | |||||
1/f Noise Measurements Falk Korndoerfer, IHP |
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1/f Noise Extractions Thomas Gneiting, AdMOS |
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Worst Cases 1/f Noise Modeling Walter Pflanzl, austriamicrosystems |
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Thermal Noise in Nonlinear Devices and Circuits Wolfgang Mathis and Jan Bremer, Uni-Hannover |
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Noise in RF Circuits and RF Noise Device Characterization Peter Baumgartner, Infineon |
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16:00 | End of the Meeting | |||||
recommended papers for further IJNM publication |
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