Arbeitskreis
MOS-Modelle und Parameterextraktion MOS Modeling and Parameter Extraction Working Group 5th International MOS-AK/GSA Workshop (co-located with the CMC Meeting and IEDM Conference) San Francisco Dec.12, 2012 |
MOS-AK/GSA Workshop Sponsors |
Technical MOS-AK/GSA Program Promoters |
The MOSIS Services |
Technical MOS-AK
Program |
Venue: | swissnex San
Francisco 730 Montgomery
Street
San Francisco, CA 94111, USA |
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Important Dates: |
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Agenda: | |
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9:00-12:00 |
Morning Session (Chair: Wladek Grabinski, MOS-AK) |
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Welcome and workshop opening Harrison Beasley, GSA and Wladek Grabinski, MOS-AK |
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T_1 | Scaling Challenges of Analog Electronics Mustafa Badaroglu IMEC (B) |
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T_2 | i-MOS: an interactive Modeling and Online
Simulation Platform Hao Wang and Mansun Chan HKUST (HK) |
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T_3 | Nonlinear Device Modeling with Scalable
X-parameters David E. Root, Mihai Marcu, Jason Horn, Jianjun Xu, Radek M. Biernacki, and Masaya Iwamoto Agilent Technologies (US) |
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Coffee Break |
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T_4 | PSP model update Gert-Jan Smit, Andries Scholten, D.B.M. Klaassen and Ramses van der Toorn* NXP Semiconductors, *Delft University (NL) |
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T_5 |
KLU and PSS implementations in NGSPICE Francesco Lannutti and Stefano Perticaroli Sapienza University of Rome (I) |
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T_6 | GCC front-end of Compact Modeling
Verilog-AMS language Laurent Lemaitre noovela (F) |
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12:00-13:00 |
Lunch |
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13:00-16:00 |
Afternoon Session (Chair: Ehrenfried Seebacher, AMS) |
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T_7 | Global Geometrical Scaling in BSIM6 Y. S. Chauhan*,**, M. Chalkiadaki***, S. Venugopalan**, M. A. Karim**, N. Paydavosi**, S. Jandhyala**, J. P. Duarte**, C. C. Enz***, A. M. Niknejad**, C. Hu** IIT Kanpur (IN), UC Berkeley (US), EPFL (CH) |
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T_8 |
SPICE Modeling of STT-RAM for Resilient
Design Zihan Xu, Ketul Sutaria, Chengen Yang, Chaitali Chakrabarti, Yu Cao Arizona State University (US) |
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T_9 | Modeling and parameter extraction of
zero-VT MOSFETs for ultra-low-voltage operation Carlos Galup-Montoro, Marcio C. Schneider and Marcio B. Machado Federal University of S Catarina (BR) |
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T_10 |
Charge trapping phenomena in MOSFETS: From
Noise to Bias Temperature Instability Gilson Wirth UFRGS (BR) |
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T_11 | Consistent parameter extraction using
different MOSFET models Luiz Alberto Pasini Melek, Rodrigo Luiz de Oliveira Pinto, Manoel Alvares, Oscar Gouveia Filho, Djones Lettnin, Márcio Cherem Schneider, and Carlos Galup-Montoro Federal University of S. Catarina (BR) |
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Coffee Break |
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Panel |
Status and
Future
of Verilog-A Compact Modeling Standardization Moderator: Larry Nagel CMC Standardization
Perspective
Keith R. Green; TI, CMC General Chair Passive Components and Interconnect Standardization for VLSI Design Narain D. Arora; Silterra Academic Perspective Carlos Galup-Montoro, FUSC Gilson Wirth, UFRGS |
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17:00 |
End of the MOS-AK Workshop |
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Committee: |
Extended MOS-AK/GSA Committee |
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