Arbeitskreis MOS-Modelle und Parameterextraktion
MOS Modeling and Parameter Extraction Working Group
MOS-AK Meeting
Noise in MOSFET Devices

Friday, 20 April 2007
Room Palladium, Schloss Premstaetten
Agenda
Technical Program Coordinator: E.Seebacher and W.Grabinski
  • Morning Session
    • 9:00-11:30 Oral Presentations
    • 10:00-10:30 (coffee break)
  • Poster Session
    • 11:30-12:00 Posters
    • 12:00-13:30 (lunch)
  • Afternoon Session
    • 13:30-16:00 Oral Presentations
    • 14:30-15:00 (coffee break)
Sponsors and Promoters
AMS
TU Graz 
ijnm_wileyEuroTraning
Workshop Program
Display Format: Citation Citation & Abstract
9:00 - 11:30 Morning Session - Chair: E. Seebacher and W.Pribyl
Welcome, Workshop Opening
and Presentation of the Modelling Activities at austriamicrosystems

Ehrenfried Seebacher, austriamicrosystems
  Activities of TU Graz Institute for Electronic
Wolfgang Pribyl, TU Graz
  Measurements and Modeling of Noise in Advanced MOSFETs
Mitiko Miura-Mattausch, IEEE Fellow, TU Hiroshima
 Starred for IJNM Numerical Simulation of Electronic Noise in Silicon MOSFETs
Christoph Jungemann, Uni München
 Starred for IJNM Noise Modeling in Lateral Asymmetric MOSFET
Ananda Sankar Roy, EPFL
  Electrical Measurements and Chip Repair with Nanoscale Probes
Peter Hadley, TU Graz
  Posters:
  Turn-key, Fully Automated SPICE Model Quality Assurance Solutions
James Ashforth-Pook, Accelicon Technologies, Europe
  A Compact Quantum Model of Nanoscale Double-Gate MOSFETs for RF and Noise Simulations
A. Lazaro, B. Nae, O. Moldovan and B. Iñiguez; Universitat Rovira i Virgili
  GNU Simulators Supporting Verilog-A Compact Model Standardization (photo)
S. Jahn, M. Brinson, M. Margraf, H. Parruitte, B. Ardouin, P. Nenzi and L. Lemaitre
Flicker Noise Modeling System
Thomas Gneiting, AdMOS
11:30-12:00 AMS Fab Tour - Guide: Ehrenfried Seebacher, austriamicrosystems
12:00-13:30 Lunch (MOS-AK Photo Session)
13:30-16:00 Afternoon Session - Chair: E. Seebacher and W.Pribyl
  1/f Noise Measurements
Falk Korndoerfer, IHP
  1/f Noise Extractions
Thomas Gneiting, AdMOS
  Worst Cases 1/f Noise Modeling
Walter Pflanzl, austriamicrosystems
 Starred for IJNM Thermal Noise in Nonlinear Devices and Circuits
Wolfgang Mathis and Jan Bremer, Uni-Hannover
 Starred for IJNM Noise in RF Circuits and RF Noise Device Characterization
Peter Baumgartner, Infineon
16:00 End of the Meeting
Starred for IJNM recommended papers for further IJNM publication
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No.#19057
update: 4-May-07 (rev.b)
Contents subject to change ©1999-2007 All rights reserved. WG
Graphics © 2007 Oliver